发明名称 SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREFOR
摘要 <p>A semiconductor structure and a manufacturing method therefor. The semiconductor structure comprises: a substrate (100); a gate stack, located on the substrate (100); a side wall (240), located on a lateral wall of the gate stack; a source/drain extension region (310), located in the substrate (100) at two sides of the gate stack, and formed through epitaxial growth; and a source/drain region (330), located in the substrate (100) at two sides of the source/drain extension region (310). Because a source/drain extension region with a high doping concentration and a shallow junction depth is formed, performance of the semiconductor structure is effectively improved.</p>
申请公布号 WO2013139064(A1) 申请公布日期 2013.09.26
申请号 WO2012CN74776 申请日期 2012.04.26
申请人 INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;YIN, HUAXIANG;MA, XIAOLONG;QIN, CHANGLIANG;XU, QIUXIA;CHEN, DAPENG 发明人 YIN, HUAXIANG;MA, XIAOLONG;QIN, CHANGLIANG;XU, QIUXIA;CHEN, DAPENG
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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