发明名称 DESTATICIZER FOR ANALYSIS
摘要 PROBLEM TO BE SOLVED: To provide a destaticizer for analysis which can be sufficiently stuck to the periphery of an analysis object sample in a precise analysis like analysis using an atomic force microscope, can suppress charging in the periphery of the analysis object sample without contaminating the analysis object sample and the peripheral environment, is free from sparks even in the case of the existence of metal around the analysis object sample, allows analysis with a covering chamber, and allows even analysis in a high-temperature environment or a vacuum environment without problems.SOLUTION: The destaticizer for analysis includes a fibrous columnar structure with a plurality of fibrous columnar materials.
申请公布号 JP2014048165(A) 申请公布日期 2014.03.17
申请号 JP20120191560 申请日期 2012.08.31
申请人 NITTO DENKO CORP 发明人 MAENO YOHEI
分类号 G01Q30/18;G01Q60/24 主分类号 G01Q30/18
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