Substrate defect detection mechanism

摘要

A method is disclosed. The method includes one or more light field cameras recording image data of a substrate during printing to the substrate and a control unit processing the image data received from the one or more light field cameras to identify defect areas in the substrate.

主权项

1. A print system comprising:
a printhead array to apply presentation content to a substrate; one or more light field cameras to record image data at sections of the substrate during application of presentation content to the substrate; and a control unit to process the image data received from the one or more light field cameras to map out a surface of the substrate using the image data to determine the focal lengths at the sections of the substrate to generate a three-dimensional surface of the substrate to identify defect areas in the substrate.