发明名称 Manufacturable sub-3 nanometer palladium gap devices for fixed electrode tunneling recognition
摘要 A technique is provided for manufacturing a nanogap in a nanodevice. An oxide is disposed on a wafer. A nanowire is disposed on the oxide. A helium ion beam is applied to cut the nanowire into a first nanowire part and a second nanowire part which forms the nanogap in the nanodevice. Applying the helium ion beam to cut the nanogap forms a signature of nanowire material in proximity to at least one opening of the nanogap.
申请公布号 US9128078(B2) 申请公布日期 2015.09.08
申请号 US201313945295 申请日期 2013.07.18
申请人 International Business Machines Corporation 发明人 Astier Yann;Bai Jingwei;Guillorn Michael A.;Papa Rao Satyavolu S.;Smith Joshua T.
分类号 H01L29/41;G01N33/487 主分类号 H01L29/41
代理机构 Cantor Colburn LLP 代理人 Cantor Colburn LLP ;Alexanian Vazken
主权项 1. A method for manufacturing a nanogap, the method comprising: disposing an oxide on a wafer; disposing a nanowire on the oxide; and applying a helium ion beam to cut the nanowire into a first nanowire part and a second nanowire part to form the nanogap in a nanodevice; wherein applying the helium ion beam to cut the nanogap forms a signature of nanowire material in proximity to at least one opening of the nanogap.
地址 Armonk NY US