发明名称 |
Manufacturable sub-3 nanometer palladium gap devices for fixed electrode tunneling recognition |
摘要 |
A technique is provided for manufacturing a nanogap in a nanodevice. An oxide is disposed on a wafer. A nanowire is disposed on the oxide. A helium ion beam is applied to cut the nanowire into a first nanowire part and a second nanowire part which forms the nanogap in the nanodevice. Applying the helium ion beam to cut the nanogap forms a signature of nanowire material in proximity to at least one opening of the nanogap. |
申请公布号 |
US9128078(B2) |
申请公布日期 |
2015.09.08 |
申请号 |
US201313945295 |
申请日期 |
2013.07.18 |
申请人 |
International Business Machines Corporation |
发明人 |
Astier Yann;Bai Jingwei;Guillorn Michael A.;Papa Rao Satyavolu S.;Smith Joshua T. |
分类号 |
H01L29/41;G01N33/487 |
主分类号 |
H01L29/41 |
代理机构 |
Cantor Colburn LLP |
代理人 |
Cantor Colburn LLP ;Alexanian Vazken |
主权项 |
1. A method for manufacturing a nanogap, the method comprising:
disposing an oxide on a wafer; disposing a nanowire on the oxide; and applying a helium ion beam to cut the nanowire into a first nanowire part and a second nanowire part to form the nanogap in a nanodevice; wherein applying the helium ion beam to cut the nanogap forms a signature of nanowire material in proximity to at least one opening of the nanogap. |
地址 |
Armonk NY US |