Method and device for detecting a conductive object

摘要

A method for detecting an electrically and/or magnetically conductive object in a vicinity of a sensor head of a device, having the following steps:
emitting a transmitting signal into the surroundings,receiving a received signal as a function of the transmitting signal and the characteristics of the object and the surroundings,analyzing a response signal formed from the received signal.;According to the invention, the detection is controlled by
providing a class system having a number of classes, which differ from one another in at least one object and/or surroundings characteristic, andclassifying instantaneous object and/or surroundings characteristics as a function of the analyzed response signal in a class of the class system, andpredefining detection characteristics which are preset in the classified class, a further response signal being detected using the predefined detection characteristics.

主权项

1. A method for detecting an electrically and/or magnetically conductive object in surroundings of a sensor head of a device, the method comprising the following steps:
emitting a transmitting signal into the surroundings; receiving a received signal as a function of the transmitting signal and characteristics of the object and the surroundings; analyzing a response signal formed from the received signal; the detection being controlled by: providing a class system having a plurality of classes differing from one another in at least one object and/or surroundings characteristic; classifying instantaneous object and/or surroundings characteristics as a function of the analyzed response signal into one of the classes of the class system, the one class defining a classified class; and detecting a further response signal using predefined detection characteristics preset in the classified class; wherein the classes have one or multiple of the classes from the group consisting of: a first class provided for gratings; a second class provided for dense objects, in particular with little overlap; a third class provided for deep objects; a fourth class provided for magnetic substrates; a fifth class provided for a certain movement direction; and a sixth class provided for nonmagnetic, conductive objects.