发明名称 DISPLAY DEVICE AND TEST LINE REPAIR METHOD THEREFOR
摘要 A display device and a test line repair method therefor. The method comprises: respectively disconnecting a first input end and a first output end of a first thin-film transistor from a test signal input line (301) in a laser cutting manner; and connecting a first spare line (306) to a test signal output line (307) in a laser welding manner. The device and method therefor enable the width to length ratio of a display device not to be changed, so that no display exception will occur during lighting detection.
申请公布号 WO2015089878(A1) 申请公布日期 2015.06.25
申请号 WO2013CN90821 申请日期 2013.12.30
申请人 SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD. 发明人 DU, PENG;SHIH, MINGHUNG
分类号 G09G3/00;G09G3/20 主分类号 G09G3/00
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