发明名称 |
DISPLAY DEVICE AND TEST LINE REPAIR METHOD THEREFOR |
摘要 |
A display device and a test line repair method therefor. The method comprises: respectively disconnecting a first input end and a first output end of a first thin-film transistor from a test signal input line (301) in a laser cutting manner; and connecting a first spare line (306) to a test signal output line (307) in a laser welding manner. The device and method therefor enable the width to length ratio of a display device not to be changed, so that no display exception will occur during lighting detection. |
申请公布号 |
WO2015089878(A1) |
申请公布日期 |
2015.06.25 |
申请号 |
WO2013CN90821 |
申请日期 |
2013.12.30 |
申请人 |
SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD. |
发明人 |
DU, PENG;SHIH, MINGHUNG |
分类号 |
G09G3/00;G09G3/20 |
主分类号 |
G09G3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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