| 摘要 |
<p>Provided is a semiconductor memory device which comprises a memory cell array including a plurality of word lines, a first dummy word line being adjacent to the outermost upper word lines among a plurality of word liens, and a second dummy word line being adjacent to the outermost lower word lines among a plurality of word lines; and a dummy word line driver for driving, independently, the first dummy word line and second dummy word line for a burn-in test. According to the semiconductor memory device, a wafer burn-in test can be performed efficiently by applying uniform stress between normal cells and dummy cells.</p> |
