发明名称 |
PHASE SHIFT MASK BLANK FOR MANUFACTURING DISPLAY DEVICE, PHASE SHIFT MASK FOR MANUFACTURING DISPLAY DEVICE AND METHOD FOR MANUFACTURING THE PHASE SHIFT MASK, AND METHOD FOR MANUFACTURING DISPLAY DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a phase shift mask blank for manufacturing a display device, which includes a phase shift film showing optical characteristics having suppressed wavelength dependency with respect to exposure light.SOLUTION: A phase shift mask blank 1 includes a transparent substrate 2 and a phase shift film 3 formed on the transparent substrate 2. The phase shift film 3 comprises a monolayer film or a multilayer film having at least one layer of a metal silicide material layer containing a metal, silicon, and at least one element of nitrogen and/or oxygen. The phase shift film 3 shows a transmittance of 3.5% or more and 8% or less at a wavelength of 365 nm, a phase difference of 160 degrees or more and 200 degrees or less at a wavelength of 365 nm, and within 5.5% of a variation of the transmittance depending on wavelength in a wavelength range from 365 nm to 436 nm. |
申请公布号 |
JP2015102633(A) |
申请公布日期 |
2015.06.04 |
申请号 |
JP20130242209 |
申请日期 |
2013.11.22 |
申请人 |
HOYA CORP ; HOYA ELECTRONICS MALAYSIA SDN BHD |
发明人 |
TSUBOI SEIJI ; YOSHIKAWA YUTAKA ; USHIDA MASAO |
分类号 |
G03F1/32;C23C14/06;G03F1/58 |
主分类号 |
G03F1/32 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|