发明名称 APPARATUS FOR INSPECTING DISPLAY CELLS
摘要 <p>An apparatus for inspecting display cells comprises: an inspection chamber to perform an inspection process to display cells formed on a substrate; a substrate stage having a plurality of vacuum holes arranged inside the inspection chamber and adsorbing the substrate to support the substrate to make the display cells side down; a first probe card arranged below the substrate stage and being in contact with first inspection pads arranged along a first side of the substrate to inspect the display cells; and a second probe card arranged below the substrate stage and being in contact with second inspection pads arranged along a second side of the substrate to inspect the display cells.</p>
申请公布号 KR20150059840(A) 申请公布日期 2015.06.03
申请号 KR20130143418 申请日期 2013.11.25
申请人 SEMES CO., LTD. 发明人 CHOI, SI YONG
分类号 G01R31/28;H01L51/50 主分类号 G01R31/28
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