发明名称 |
Twin-well lateral silicon controlled rectifier |
摘要 |
A LSCR includes a substrate having a semiconductor surface which is p-doped. A first nwell and a second nwell spaced apart from one another are in the semiconductor surface by a lateral spacing distance. A first n+ diffusion region and a first p+ diffusion region are in the first nwell. A second n+ diffusion region is in the second nwell. A second p+ diffusion is between the first nwell and second nwell which provides a contact to the semiconductor surface. Dielectric isolation is between the first n+ diffusion region and first p+ diffusion region, along a periphery between the first nwell and the semiconductor surface, and along a periphery between the second nwell and the semiconductor surface. A resistor provides coupling between the second n+ diffusion region and second p+ diffusion. |
申请公布号 |
US9035352(B2) |
申请公布日期 |
2015.05.19 |
申请号 |
US201213459504 |
申请日期 |
2012.04.30 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
Boselli Gianluca;Sankaralingam Rajkumar |
分类号 |
H01L29/66;H01L29/74;H01L27/02;H01L23/62 |
主分类号 |
H01L29/66 |
代理机构 |
|
代理人 |
Garner Jacqueline J.;Cimino Frank |
主权项 |
1. A lateral silicon controlled rectifier (LSCR), comprising:
a substrate having a semiconductor surface which is p-doped; a first nwell and a second nwell spaced apart from one another in said semiconductor surface by a lateral spacing distance; a first n+ diffusion region and a first p+ diffusion region in said first nwell, wherein the first n+ diffusion region is connected directly to a high impedance node and the first p+ diffusion region is connected directly to a pad to be protected; a second n+ diffusion region entirely in said second nwell, wherein the second n+ diffusion region is connected directly to a ground reference; a second p+ diffusion region between said first nwell and said second nwell providing a contact to said semiconductor surface; dielectric isolation between said first n+ diffusion region and said first p+ diffusion region, along a periphery of said first nwell at said semiconductor surface, and along a periphery of said second nwell at said semiconductor surface, and a resistor coupling said second n+ diffusion region to said second p+ diffusion region. |
地址 |
Dallas TX US |