发明名称 Solder in cavity interconnection structures
摘要 The present disclosure relates to the field of fabricating microelectronic packages, wherein cavities are formed in a dielectric layer deposited on a first substrate to maintain separation between soldered interconnections. In one embodiment, the cavities may have sloped sidewalls. In another embodiment, a solder paste may be deposited in the cavities and upon heating solder structures may be formed. In other embodiments, the solder structures may be placed in the cavities or may be formed on a second substrate to which the first substrate may be connected. In still other embodiments, solder structures may be formed on both the first substrate and a second substrate. The solder structures may be used to form solder interconnects by contact and reflow with either contact lands or solder structures on a second substrate.
申请公布号 US9006890(B2) 申请公布日期 2015.04.14
申请号 US201313740698 申请日期 2013.01.14
申请人 Intel Corporation 发明人 Hu Chuan;Liff Shawna M;Clemons Gregory S
分类号 H01L23/48;H05K1/18;H01L23/00 主分类号 H01L23/48
代理机构 Winkle, PLLC 代理人 Winkle, PLLC
主权项 1. A microelectronic device, comprising: a first substrate having a plurality of bond pads proximate a contact surface of the first substrate; a first dielectric layer disposed over the plurality of first substrate bond pads and the first substrate contact surface, wherein the first dielectric layer has a plurality of cavities extending therethrough to each of the plurality of first substrate bond pads, wherein inter-cavity walls of the first dielectric layer reside between adjacent cavities, and wherein the inter-cavity walls have sloped sidewalls, wherein the inter-cavity walls include contact structures formed between each of the adjacent cavities, and wherein the inter-cavity wall contact structures are substantially planar to the first substrate contact surface; a second substrate having a plurality of contact lands proximate a contact surface of the second substrate; and solder interconnections between the plurality of first substrate bond pads and corresponding plurality of the second substrate contact lands.
地址 Santa Clara CA US