| 摘要 |
A scanning system for scanning an object, and a corresponding bracket and method are described. The system has a frame defining a scanning chamber in which the object to be scanned is placed. The system also has a displacement assembly which displaces the object into and out of the scanning chamber. The system can also have a source which emits electromagnetic radiation or X-rays against the object within the scanning chamber such that the EM radiation passes through the object. Finally, the system can also have detectors arranged around the scanning chamber which detect the EM radiation which passes through the object. Each of the detectors forms a detector angle with a plane which can vary from one detector to the next. Similarly, the source can form an angle with the horizontal plane. The system, bracket, and method allow for the production of representative three-dimensional views of the object. |
