发明名称 System and method for testing a radio frequency (RF) multiple-input-multiple-output (MIMO) device under test (DUT)
摘要 A system and method for testing a radio frequency (RF) multiple-input-multiple-output (MIMO) device under test (DUT) in which system costs are minimized by using fewer precision RF MIMO testing subsystems together with lower precision integrated RF MIMO signal conversion circuitry to test the DUT.
申请公布号 US9002290(B2) 申请公布日期 2015.04.07
申请号 US201213467518 申请日期 2012.05.09
申请人 Litepoint Corporation 发明人 Olgaard Christian Volf
分类号 H04B17/00;H04B7/04 主分类号 H04B17/00
代理机构 Vedder Price, P.C. 代理人 Vedder Price, P.C.
主权项 1. An apparatus including a system for testing a radio frequency (RF) multiple-input-multiple-output (MIMO) device under test (DUT), comprising: a plurality of RF signal ports to convey a corresponding plurality of MIMO signals, including a plurality of receive MIMO signals received from a DUT; signal routing circuitry coupled to said plurality of RF signal ports to provide a plurality of replica MIMO signals corresponding to said plurality of receive MIMO signals, anda composite signal including said plurality of receive MIMO signals; first signal processing circuitry coupled to said signal routing circuitry to provide one or more processed signals by processing at least one of said composite signal, anda first portion of said plurality of replica MIMO signals; signal conversion circuitry coupled to said signal routing circuitry to convert a second portion of said plurality of replica MIMO signals to provide one or more converted signals; second signal processing circuitry coupled to said first signal processing circuitry and said signal conversion circuitry to process said one or more processed signals and said one or more converted signals to provide test data indicative of one or more signal transmission performance parameters of said DUT.
地址 Sunnyvale CA US