发明名称 MEMORY CELL AND PAGE BREAK INSPECTION
摘要 <p>A method of inspecting an array of memory blocks with page breaks disposed between them. The memory array is imaged with a sensor. Pixels of the image within a boundary distance of a horizontal single line of pixels are inspected to determine horizontal edges of the memory blocks to an accuracy of a single pixel. Pixels of the image within a boundary distance of a vertical single line of pixels are inspected to determine vertical edges of the memory blocks to an accuracy of a single pixel. An image of a first and second memor block are compared on a pixel by pixel basis to determine differences and the differences are flagged as potential memory block defects. Images of the page breaks are compared and the differences are flagged as potential page break defects.</p>
申请公布号 KR101506238(B1) 申请公布日期 2015.03.30
申请号 KR20107007469 申请日期 2008.09.08
申请人 发明人
分类号 G11C8/12;G11C29/00;H04N7/18 主分类号 G11C8/12
代理机构 代理人
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