发明名称 |
SYSTEMS AND METHODS TO MITIGATE NITRIDE PRECIPITATES |
摘要 |
A method of fabricating a semiconductor device is disclosed. A substrate having an oxide layer is provided. At least a portion of the oxide layer is removed and forms a nitride layer. The nitride layer is removed, leaving nitride precipitates. The nitride precipitates are removed using phosphoric acid. |
申请公布号 |
US2015024600(A1) |
申请公布日期 |
2015.01.22 |
申请号 |
US201313942906 |
申请日期 |
2013.07.16 |
申请人 |
Taiwan Semiconductor Manufacturing Co., Ltd. |
发明人 |
Li Jung-Jui |
分类号 |
H01L21/311 |
主分类号 |
H01L21/311 |
代理机构 |
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代理人 |
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主权项 |
1. A method of fabricating a semiconductor device, the method comprising:
providing a substrate having an oxide layer; removing at least a portion of the oxide layer by reacting HF and NH3 with the oxide layer to form a nitride layer over an unconsumed portion of the oxide layer; removing the nitride layer and leaving a nitride precipitate byproduct on the unconsumed portion of the oxide layer; and removing the nitride precipitate byproduct by dipping the substrate in a liquid solution of phosphoric acid. |
地址 |
Hsin-Chu TW |