发明名称 SYSTEMS AND METHODS TO MITIGATE NITRIDE PRECIPITATES
摘要 A method of fabricating a semiconductor device is disclosed. A substrate having an oxide layer is provided. At least a portion of the oxide layer is removed and forms a nitride layer. The nitride layer is removed, leaving nitride precipitates. The nitride precipitates are removed using phosphoric acid.
申请公布号 US2015024600(A1) 申请公布日期 2015.01.22
申请号 US201313942906 申请日期 2013.07.16
申请人 Taiwan Semiconductor Manufacturing Co., Ltd. 发明人 Li Jung-Jui
分类号 H01L21/311 主分类号 H01L21/311
代理机构 代理人
主权项 1. A method of fabricating a semiconductor device, the method comprising: providing a substrate having an oxide layer; removing at least a portion of the oxide layer by reacting HF and NH3 with the oxide layer to form a nitride layer over an unconsumed portion of the oxide layer; removing the nitride layer and leaving a nitride precipitate byproduct on the unconsumed portion of the oxide layer; and removing the nitride precipitate byproduct by dipping the substrate in a liquid solution of phosphoric acid.
地址 Hsin-Chu TW