| 摘要 |
PROBLEM TO BE SOLVED: To provide a defect detection device and a defect detection method capable of surely detecting defect with at least one of a vertical flaw detection method and an angle beam method.SOLUTION: In a defect detection device 1a, a first probe 2 which is arranged on the surface of a billet W and includes a transmission part for transmitting an ultrasonic wave to the inside of the billet W along a direction vertical to the surface and a wave reception part for receiving an ultrasonic wave returned by reflecting with a defect existing inside including at least the surface layer of the billet W is provided. Also, in the defect detection device 1a, a second probe 3a and a third probe 4a which are arranged on the surface of the billet W and include transmission parts for transmitting the ultrasonic wave to the inside of the billet W along the direction being oblique and closer to the first probe 2 with respect to the surface and wave reception parts for receiving the ultrasonic wave returned by reflecting with the defect existing inside including at least the surface layer of the billet W are provided. |
