发明名称 Surface acoustic wave resonator, surface acoustic wave oscillator, and electronic instrument
摘要 A SAW resonator which, using a quartz crystal substrate with Euler angles (−1.5°≦φ≦1.5°, 117°≦θ≦142°, and 41.9°≦|ψ|≦49.57°), includes an IDT that excites a stop band upper end mode SAW, and an inter-electrode finger groove provided between electrode fingers configuring the IDT. When a wavelength of the SAW is λ, a first depth of the inter-electrode finger groove is G, a line occupation rate of the IDT is η, and an electrode film thickness of the IDT is H, λ, G, η and H satisfy the relationship of 0<H≦0.005λ, 0.01λ≦G≦0.09λ, and 0.18≦η≦0.71.
申请公布号 US8933612(B2) 申请公布日期 2015.01.13
申请号 US201213460149 申请日期 2012.04.30
申请人 Seiko Epson Corporation 发明人 Yamanaka Kunihito
分类号 H03H9/25;H03H9/02;H03H9/145 主分类号 H03H9/25
代理机构 Harness, Dickey &amp; Pierce, P.L.C. 代理人 Harness, Dickey &amp; Pierce, P.L.C.
主权项 1. A surface acoustic wave resonator provided on a quartz crystal substrate with Euler angles (−1.5°≦φ≦1.5°, 117°≦θ≦142°, and 41.9°≦|ψ|≦49.57°), comprising: an interdigital transducer (IDT) that excites a stop band upper end mode surface acoustic wave; and an inter-electrode finger groove provided between electrode fingers configuring the IDT, wherein when a wavelength of the surface acoustic wave is λ, a first depth of the inter-electrode finger groove is G, a line occupation rate of the IDT is η, and an electrode film thickness of the IDT is H, λ, G, η and H satisfy the relationship of0<H≦0.005λ,0.01λ≦G≦0.09λ, and0.18≦η≦0.71.
地址 Tokyo JP