摘要 |
According to one embodiment, the semiconductor memory device includes a first memory cell, first, second, third and fourth interconnect lines and first, second and third write circuits. The first memory cell includes a first magnetic tunnel junction (MTJ) element. The first interconnect line is connected to one end of the first memory cell. The first write circuit drives the first interconnect line. The second interconnect line is connected to the other end of the first memory cell. The second write circuit drives the second interconnect line. The third and fourth interconnect lines are adjacent to the first memory cell. The third write circuit drives the third and fourth interconnect lines. |