发明名称 MAGNETIC MEASUREMENT DEVICE
摘要 The present invention provides a magnetic measurement device which can measure the magnetic characteristics in a microregion of a thin plate magnetic sample. After a magnetic sample is applied by a magnetic field and magnetized accordingly, by scanning the magnetic sample using a measuring part, the magnetic flux leakage in the magnetic sample can be measured. The magnetic flux leaks outside by magnetizing a first region and a second region of the magnetic sample in reciprocally opposite directions and reducing the demagnetizing field. Specifically, a magnetic field generating part with at least a pair of magnetic poles is used to perform the magnetization of multiple poles, or the magnetic field generating part applies a damped oscillation magnetic field to perform the magnetization, or a local magnetic field generating part which applies an alternating magnetic field and scans the surface of the sample at the same time is used to perform the magnetization.
申请公布号 EP2808691(A1) 申请公布日期 2014.12.03
申请号 EP20120866514 申请日期 2012.12.13
申请人 TDK CORPORATION 发明人 SUZUKI, KENICHI;CHIKAMATSU, TSUTOMU;OGAWA, AKIO;CHOI, KYUNG-KU;HASHIMOTO, RYUJI
分类号 G01R33/12;G01R33/10 主分类号 G01R33/12
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