发明名称 |
MAGNETIC MEASUREMENT DEVICE |
摘要 |
The present invention provides a magnetic measurement device which can measure the magnetic characteristics in a microregion of a thin plate magnetic sample. After a magnetic sample is applied by a magnetic field and magnetized accordingly, by scanning the magnetic sample using a measuring part, the magnetic flux leakage in the magnetic sample can be measured. The magnetic flux leaks outside by magnetizing a first region and a second region of the magnetic sample in reciprocally opposite directions and reducing the demagnetizing field. Specifically, a magnetic field generating part with at least a pair of magnetic poles is used to perform the magnetization of multiple poles, or the magnetic field generating part applies a damped oscillation magnetic field to perform the magnetization, or a local magnetic field generating part which applies an alternating magnetic field and scans the surface of the sample at the same time is used to perform the magnetization. |
申请公布号 |
EP2808691(A1) |
申请公布日期 |
2014.12.03 |
申请号 |
EP20120866514 |
申请日期 |
2012.12.13 |
申请人 |
TDK CORPORATION |
发明人 |
SUZUKI, KENICHI;CHIKAMATSU, TSUTOMU;OGAWA, AKIO;CHOI, KYUNG-KU;HASHIMOTO, RYUJI |
分类号 |
G01R33/12;G01R33/10 |
主分类号 |
G01R33/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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