Ion detection arrangement

摘要

A mass spectrometer is disclosed having a mass analyzer with a mass-to-charge dispersive element for separating ions according to their mass-to-charge ratios along a dispersive plane and an ion deflector to deflect ions leaving the mass analyzer in the dispersive plane. A shielding arrangement, located between the dispersive element and the ion deflector is arranged to define the portion of the beam to be deflected by the ion deflector. The deflected beam is steered onto a beam defining aperture, located at the focal plane of the mass analyzer is detected by at least one ion detector, located downstream from the beam defining aperture.

主权项

1. A mass spectrometer, comprising:
a mass analyzer, comprising a mass-to-charge dispersive element, the mass analyzer being arranged to receive ions, to angularly separate the ions according to their mass-to-charge ratios along a dispersive plane and to focus ions of different mass-to-charge ratios in different beams at respective different focal points on a focal plane; an ion deflector, arranged downstream from the dispersive element to deflect ions in at least one of the different beams leaving the mass analyzer in the dispersive plane; a shielding arrangement, located between the dispersive element and the ion deflector and being arranged to select the at least one of the different beams to be deflected by the ion deflector; a beam defining aperture, located downstream from the ion deflector and substantially at the focal plane of the mass analyzer; and at least one ion detector, located downstream from the beam defining aperture.