| 摘要 |
<p>PROBLEM TO BE SOLVED: To measure three-dimensional information on a shape of portion of an analyte which is conventionally difficult to measure.SOLUTION: A three-dimensional information measuring apparatus 10 includes a light source unit 11, an imaging unit 12, a support unit 13 and a control unit 14. The light source unit 11 can emit pattern light having a plurality of borderlines along a first direction. The imaging unit 12 images an analyte to which the pattern light is emitted. The support unit 13 supports the light source unit 11 and the imaging unit 12 so as to be rotatable with a rotation shaft RX as a center. The control unit 14 generates three-dimensional information of the analyte on the basis of images obtained by imaging of the imaging unit 12 in a state in which the pattern light is emitted to the analyte at a plurality of different rotational positions.</p> |
