| 摘要 |
<p>PROBLEM TO BE SOLVED: To incorporate a data saving function into a resistor for a scan test.SOLUTION: A scan flip-flop 110 has first, second, and third storage circuits. The first storage circuit 111 functions as a resistor of a combinational circuit at a normal operation. The second storage circuit 112 is used for backing up the first storage circuit. The third storage circuit 113 has a function that transmits data to a flip-flop at a next stage. Further, the second storage circuit has a function that writes data of the first storage circuit in the third storage circuit, and a function that writes data of the third storage circuit in the first storage circuit. Data of the first storage circuit can be extracted to the outside, and data can bet set in the first storage circuit from the outside at any time.</p> |
