发明名称 Method for forming high density patterns
摘要 In one or more embodiments, a method is provided for forming an integrated circuit with a pattern of isolated features having a final density of isolated features that is greater than a starting density of isolated features in an integrated circuit by a multiple of two or more. The method can include forming a pattern of pillars having a density X, and forming a pattern of holes amongst the pillars, the holes having a density at least X. The pillars can be selectively removed to form a pattern of holes having a density at least 2X. In some embodiments, plugs can be formed in the pattern of holes, such as by epitaxial deposition on the substrate, in order to provide a pattern of pillars having a density 2X. In other embodiments, the pattern of holes can be transferred to the substrate by etching.
申请公布号 US8871648(B2) 申请公布日期 2014.10.28
申请号 US201213690266 申请日期 2012.11.30
申请人 Micron Technology, Inc. 发明人 Zhou Baosuo;Sandhu Gurtej S.;Niroomand Ardavan
分类号 H01L21/311;H01L21/033;H01L21/768 主分类号 H01L21/311
代理机构 Knobbe, Martens, Olson & Bear LLP 代理人 Knobbe, Martens, Olson & Bear LLP
主权项 1. A method for integrated circuit fabrication, comprising: providing a substrate; providing a set of spaced-apart pillars over the substrate; replacing the pillars with a first plurality of holes; providing a second plurality of holes interspersed amongst the first plurality of holes; and forming a second set of pillars in the first and second pluralities of holes.
地址 Boise ID US