发明名称 LAMINATE STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To provide a laminate structure (such as a thin film capacitor) and a method for manufacturing the same, capable of using a conductive material with a low melting point as an electrode material and improving characteristics of a dielectric layer.SOLUTION: A method for manufacturing a laminate structure comprises a step (a), a step (b), a step (c), and a step (d). The step (a) includes forming a deposition layer serving as a dielectric layer 2 on a base material composed of a conductive material having a higher melting point than a conductive material used to form a second electrode layer 12. The step (b) is performed after the step (a), and includes forming a dielectric layer 2 from the deposition layer by thermally processing the deposition layer. The step (c) is performed after the step (b), and includes forming a first electrode layer 11 on the dielectric layer 2. The step (d) is performed after the step (b), and includes forming a second electrode layer 12 on a ground layer 3 using the base material as the ground layer 3.</p>
申请公布号 JP2014179357(A) 申请公布日期 2014.09.25
申请号 JP20110232336 申请日期 2011.10.23
申请人 SANYO ELECTRIC CO LTD 发明人 NOGUCHI HITOSHI
分类号 H01G4/12;H01G4/33;H05K1/16;H05K3/46 主分类号 H01G4/12
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