发明名称 Method of forming polysilicon layer and method of manufacturing thin film transistor using the polysilicon layer
摘要 In one aspect, a method of forming a polysilicon (poly-Si) layer and a method of manufacturing a thin film transistor (TFT) using the poly-Si layer is provided. In one aspect, the method of forming a polysilicon (poly-Si) layer includes forming an amorphous silicon (a-Si) layer on a substrate in a chamber; cleaning the chamber; removing fluorine (F) generated while cleaning the chamber; forming a metal catalyst layer for crystallization, on the a-Si layer; and crystallizing the a-Si layer into a poly-Si layer by performing a thermal processing operation.
申请公布号 US8841194(B2) 申请公布日期 2014.09.23
申请号 US201213485684 申请日期 2012.05.31
申请人 Samsung Display Co., Ltd. 发明人 Park Jong-Ryuk;Chung Yun-Mo;Lee Tak-Young;Lee Kil-Won
分类号 H01L21/336;H01L21/20 主分类号 H01L21/336
代理机构 Knobbe Martens Olson & Bear LLP 代理人 Knobbe Martens Olson & Bear LLP
主权项 1. A method of forming a polysilicon (poly-Si) layer, the method comprising: forming an amorphous silicon (a-Si) layer on a substrate in a chamber; cleaning the chamber; removing fluorine (F) generated while cleaning the chamber; forming a metal catalyst layer on the a-Si layer; and crystallizing the a-Si layer into a poly-Si layer by performing a thermal processing operation.
地址 Yongin, Gyeonggi-Do KR