发明名称 MASK FOR DUAL TONE DEVELOPMENT
摘要 A mask for dual tone development including a opening pattern region and a partial transparent pattern is provided. The opening pattern region includes a plurality of transparent patterns and a plurality of opaque patterns, and a plurality of opening patterns is defined in a photoresist for dual tone development by the transparent patterns and the opaque patterns. The partial transparent pattern surrounds the opening pattern region.
申请公布号 US2014255829(A1) 申请公布日期 2014.09.11
申请号 US201313896334 申请日期 2013.05.17
申请人 Powerchip Technology Corporation 发明人 Chang Yi-Shiang;Lin Chia-Chi;Lin Hung-Ming
分类号 G03F1/50 主分类号 G03F1/50
代理机构 代理人
主权项 1. A mask for dual tone development, comprising: a opening pattern region, comprising a plurality of transparent patterns and a plurality of opaque patterns, wherein a plurality of opening patterns is defined in a photoresist for dual tone development by the transparent patterns and the opaque patterns; and a partial transparent pattern, surrounding the opening pattern region.
地址 Hsinchu TW