发明名称 TEMPERATURE MEASUREMENT DEVICE
摘要 In an embodiment, a temperature measurement device is provided with: light collection means; extraction means; optical intensity calculation means; and temperature measurement means. The light collection means collects the emission spectrum of a measurement subject. The extraction means extracts beams having the wavelength of the atomic spectral lines and a beam having a wavelength in a wavelength region where there are no atomic spectral lines, from the emission spectrum collected by the aforementioned light collection means. The optical intensity calculation means calculates the optical intensities of the beams extracted by the aforementioned extraction means. The temperature measurement means calculates the temperature of the aforementioned measurement subject, based on the intensities of the beams calculated by the aforementioned optical intensity calculation means.
申请公布号 US2014219312(A1) 申请公布日期 2014.08.07
申请号 US201414169651 申请日期 2014.01.31
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 UCHII Toshiyuki;Mori Tadashi
分类号 G01J5/00 主分类号 G01J5/00
代理机构 代理人
主权项 1. A temperature measurement device that measures temperature using an emission spectrum of a measurement subject, comprising: a light collection means for collecting an emission spectrum of said measurement subject; an extraction means for extracting light having a wavelength of atomic spectral lines and light having a wavelength in a wavelength region where there are no atomic spectral lines, from said emission spectrum collected by said light collection means; an optical intensity calculation means for calculating an intensity of each of beams extracted by said extraction means; and a temperature measurement means for calculating a temperature of said measurement subject based on an intensity of each of beams calculated by said optical intensity calculation means.
地址 Minato-ku JP
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