发明名称 APPARATUS FOR INSPECTING TOUCH PANEL AND METHOD THEREOF
摘要 Disclosed herein is an apparatus for inspecting a touch panel and a method thereof, the apparatus includes: a capacitance measuring unit measuring capacitance value of a number of regions set on a touch panel, and a defect determining unit determining whether or not a specific region is defective, by comparing the capacitance value of the specific region with the capacitance value of an adjacent region. According to the present embodiments, a touch panel having an improved defect detection ability and a method thereof, by comparing with capacitance of regions adjacent to each other, are provided.
申请公布号 US2014197845(A1) 申请公布日期 2014.07.17
申请号 US201313961104 申请日期 2013.08.07
申请人 Samsung Display Co., Ltd. 发明人 KO Jun-Young
分类号 G01R31/02 主分类号 G01R31/02
代理机构 代理人
主权项 1. An apparatus for inspecting a touch panel comprising, a capacitance measuring unit configured to measure a capacitance value of a plurality of regions of a touch panel; and a defect determining unit configured to determine whether or not a specific region is defective by comparing a capacitance value of the specific region with a capacitance value of an adjacent region.
地址 Yongin City KR