发明名称 |
APPARATUS FOR INSPECTING TOUCH PANEL AND METHOD THEREOF |
摘要 |
Disclosed herein is an apparatus for inspecting a touch panel and a method thereof, the apparatus includes: a capacitance measuring unit measuring capacitance value of a number of regions set on a touch panel, and a defect determining unit determining whether or not a specific region is defective, by comparing the capacitance value of the specific region with the capacitance value of an adjacent region. According to the present embodiments, a touch panel having an improved defect detection ability and a method thereof, by comparing with capacitance of regions adjacent to each other, are provided. |
申请公布号 |
US2014197845(A1) |
申请公布日期 |
2014.07.17 |
申请号 |
US201313961104 |
申请日期 |
2013.08.07 |
申请人 |
Samsung Display Co., Ltd. |
发明人 |
KO Jun-Young |
分类号 |
G01R31/02 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
1. An apparatus for inspecting a touch panel comprising,
a capacitance measuring unit configured to measure a capacitance value of a plurality of regions of a touch panel; and a defect determining unit configured to determine whether or not a specific region is defective by comparing a capacitance value of the specific region with a capacitance value of an adjacent region. |
地址 |
Yongin City KR |