发明名称 PROJECTION EXPOSURE APPARATUS AND PROJECTION EXPOSURE METHOD
摘要 PROBLEM TO BE SOLVED: To lighten exposure unevenness due to aberration of a projection optical system.SOLUTION: A projection exposure apparatus comprises a plurality of exposure means Ex1, Ex2, and Ex3 which perform overlay exposure of a particular exposure pattern to a surface to be exposed S by a light source element group 2 in which a plurality of light source elements are arrayed and a projection optical system 3 which projects a pattern formed by the light source element group 2 onto a surface to be exposed. One of the plurality of exposure means arranges the light source element group 2 at a first position within an effective field of view Vr of the projection optical system 3, and another one of the plurality of exposure means arranges the light source element group 2 at a second position, which is different from the first position, within the effective field of view Vr of the projection optical system 3.
申请公布号 JP2014115482(A) 申请公布日期 2014.06.26
申请号 JP20120269810 申请日期 2012.12.10
申请人 V TECHNOLOGY CO LTD 发明人 KAJIYAMA KOICHI;MIZUMURA MICHINOBU;KANAO MASAYASU;ISHIKAWA SUSUMU
分类号 G03F7/20;H01L21/027 主分类号 G03F7/20
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