发明名称 Integrated Circuits With Non-Volatile Memory and Methods for Manufacture
摘要 Semiconductor devices and the manufacture of such semiconductor devices are described. According to various aspects of the disclosure, a semiconductor device can include a memory region, a first logic region, and a second logic region. A select gate can be formed in the memory region of the device and a first logic gate formed in the logic region. A charge trapping dielectric can then be disposed and removed from a second logic region. A gate conductor layer can then be disposed on the device and etched to define a memory gate on the sidewall of the select gate and a second logic gate in the second logic region.
申请公布号 US2014167139(A1) 申请公布日期 2014.06.19
申请号 US201213715565 申请日期 2012.12.14
申请人 SPANSION LLC 发明人 CHANG Kuo Tung;CHEN Chun;FANG Shenqing
分类号 H01L29/40;H01L29/423 主分类号 H01L29/40
代理机构 代理人
主权项 1. A method of manufacturing a semiconductor device that includes a first region, a second region, and a third region, comprising: forming a select gate in the first region; forming a first logic gate in the second region; disposing a charge trapping dielectric; removing the charge trapping dielectric from the third region; disposing a gate conductor layer; and etching the gate conductor layer to define a memory gate on a sidewall of the select gate and a second logic gate in the third region.
地址 Sunnyvale CA US