发明名称 SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a semiconductor device that corrects an on resistance of an input/output circuit in response to a temperature and a supply voltage during actual use.SOLUTION: The semiconductor device includes: an R/B pin 21 for outputting a signal indicative of an operational state; a DQ pin 31 for inputting/outputting data; a plurality of first MOS transistors supplied at one end of a current path with a first voltage corresponding to a voltage value of the R/B pin 21; a plurality of second MOS transistors supplied at one end of a current path with a second voltage corresponding to a voltage value of the DQ pin 31; a voltage comparison circuit CP1 for comparing the voltage value of the R/B pin 21 with a reference voltage and outputting a first comparison signal depending on the result of comparison; and a ZQ correction control circuit 17 for controlling a first number by which the plurality of first MOS transistors are turned on, on the basis of the first comparison signal, and controlling a second number by which the plurality of second MOS transistors are turned on in response to the first number.</p>
申请公布号 JP2014103551(A) 申请公布日期 2014.06.05
申请号 JP20120254582 申请日期 2012.11.20
申请人 TOSHIBA CORP 发明人 YAMAI SHOTARO;MATSUDERA KATSUKI
分类号 H03K19/0175;G11C16/04;G11C16/06;H01L21/822;H01L27/04 主分类号 H03K19/0175
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