发明名称 WAFER EDGE TRIMMING METHOD
摘要 A wafer edge trimming method comprises steps as follows: Firstly, an etch-resistant layer is formed on a surface of a wafer. A wet treatment process is then performed to remove a portion of the etch-resistant layer, so as to expose a portion of the surface adjacent to an edge of the wafer. Subsequently, an etching process is performed to remove a portion of the wafer that is not covered by the remained etch-resistant layer.
申请公布号 US2014113452(A1) 申请公布日期 2014.04.24
申请号 US201213654425 申请日期 2012.10.18
申请人 UNITED MICROELECTRONICS CORP. 发明人 LIN CHU-FU;CHANG CHUNG-SUNG;CHEN CHUN-HUNG;LIN MING-TSE;LIN YUNG-CHANG
分类号 H01L21/306 主分类号 H01L21/306
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