Method of fabricating alignment layer of liquid crystal display device and testing the alignment layer

摘要

An alignment layer is tested using an AFM (Atomic Force Microscope) and a FT-IR (Fourier Transformation Infrared Spectroscope) under various process conditions so that inferiority of the alignment layer can be detected and optimum process conditions can be obtained, thereby minimizing the inferiority of the alignment layer by applying the optimum process conditions.