发明名称 THE MEASURING METHOD OF MATERIAL PROPERTY IN HYPERBARIC ENVIRONMENT
摘要 The present invention relates to a device for measuring the properties of facility materials exposed in an hyperbaric environment. The device for measuring material properties in a hyperbaric environment accurately grasps the property variation of materials for a facility exposed in a hyperbaric environment by obtaining measured data on ultrasonic waves and resistivity of a sample using a first measuring member including an ultrasonic wave sensor and a resistivity sensing part, and calculating the results obtained by measuring the properties of the sample by accurately analyzing the measured data of the sample using a second measuring member. Accordingly, the present invention can accurately measure the properties of materials of an industrial facility even if an error or failure is generated in any one characteristic among the characteristics of the ultrasonic waves and the resistivity used during a step for measuring the properties of the materials for a high pressure facility.
申请公布号 KR101367644(B1) 申请公布日期 2014.03.12
申请号 KR20120135687 申请日期 2012.11.28
申请人 KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE 发明人 NAHM, SEUNG HOON;NAM, YOUNG HYUN;BAEK, UN BONG;PARK, JONG SEO
分类号 G01N29/04;G01N27/04 主分类号 G01N29/04
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