| 摘要 |
Semiconductor chips are provided. The semiconductor chip includes a selection phase clock generator and a data input/output portion. The selection phase clock generator is configured to receive an external clock signal and an inversed external clock signal to generate phase clock signals, configured to receive a first external test clock signal and a second external test clock signal to generate test phase clock signals, and configured to output the phase clock signals or the test phase clock signals as selection phase clock signals in response to a test mode signal. |
