发明名称 INTERFERENCE EXPOSURE APPARATUS, INTERFERENCE EXPOSURE METHOD, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 According to one embodiment, an interference exposure apparatus of the embodiment includes a light path changing section in which a changing element adapted to change a light path direction and a light path length of a plurality of light beams with respect to the plurality of light beams having coherency with respect to each other is arranged substantially axisymmetrically; and an adjusting section for adjusting one part of the light beam entering a substrate by intensity changing or phase changing one part of the light beam corresponding to a pattern shape to form on the substrate. A light beam exit from the light path changing section and the adjusting section is interfered on the substrate to carry out an interference exposure on the substrate.
申请公布号 KR101364431(B1) 申请公布日期 2014.02.17
申请号 KR20120027295 申请日期 2012.03.16
申请人 发明人
分类号 G03F7/20;H01L21/027 主分类号 G03F7/20
代理机构 代理人
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