发明名称 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN
摘要 PROBLEM TO BE SOLVED: To provide a resist composition from which a resist pattern with excellent line edge roughness can be produced.SOLUTION: The resist composition comprises a resin including a structural unit expressed by formula (I), a resin including a structural unit having an acid-labile group, and an acid generator expressed by formula (II). In the formulae, Rrepresents a hydrogen atom or a methyl group; Arepresents an alkanediyl group; Rrepresents a hydrocarbon group having a fluorine atom; Xrepresents an alkanediyl group which may be substituted with a hydroxy group or -ORand in which a methylene group constituting the alkanediyl group may be replaced by an oxygen atom or a carbonyl group; Rand Reach represent a hydrocarbon group which may be substituted with a fluorine atom or a hydroxy group and in which a methylene group constituting the hydrocarbon group may be replaced by an oxygen atom or a carbonyl group; and Zrepresents an organic cation.
申请公布号 JP2014029487(A) 申请公布日期 2014.02.13
申请号 JP20130123283 申请日期 2013.06.12
申请人 SUMITOMO CHEMICAL CO LTD 发明人 ICHIKAWA KOJI;MUKAI YUICHI;YOSHIDA MASASHI
分类号 G03F7/039;C08F20/28;G03F7/004;H01L21/027 主分类号 G03F7/039
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