发明名称 SPECIMEN BOX FOR ELECTRON MICROSCOPE
摘要 The present invention relates to a specimen box for an electron microscope, which comprises a first substrate, a second substrate, and a metal adhesion layer. The first substrate has a first surface, a second surface, a first concave, and one or more first through holes, wherein the first through hole penetrates through the first substrate. The second substrate has a third surface, a forth surface, and a second concave. Besides, the metal adhesion layer is disposed between the first substrate and the second substrate to form a space for a specimen placed therein. In addition, the specimen box of the present invention further comprises one or more plugs. When the plug is assembled into the first through hole to seal the specimen box, the in-situ observation can be accomplished by using an electron microscope.
申请公布号 KR101356673(B1) 申请公布日期 2014.02.03
申请号 KR20120068468 申请日期 2012.06.26
申请人 发明人
分类号 H01J37/20;H01J37/26 主分类号 H01J37/20
代理机构 代理人
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