| 摘要 |
PROBLEM TO BE SOLVED: To provide a quality inspection method and a quality inspection device capable of efficiently performing highly accurate and high-speed inspection at low costs.SOLUTION: A quality inspection device includes imaging means 2 for imaging an inspected surface, storage means 3 for storing a plurality of master images where a feature group including two or more feature parts has been set, detection means 5 for detecting a feature group similar to the feature group for a captured inspected image 11, extraction means 6 for extracting a master image 12 having a positional relationship approximately similar to the positional relationship of the respective feature parts of the feature group detected by the detection means 5 from the storage means 3, and determination means 7 for determining the presence of defects of an inspected surface 80 by comparison with the master image extracted by the extraction means 6. |
