发明名称 CHARGED PARTICLE RADIATION APPARATUS, AND METHOD FOR DISPLAYING THREE-DIMENSIONAL INFORMATION IN CHARGED PARTICLE RADIATION APPARATUS
摘要 Disclosed is a charged particle radiation apparatus capable of capturing a change in a sample due to gaseous atmosphere, light irradiation, heating or the like without exposing the sample to atmosphere. The present invention relates to a sample holder provided with a sample stage that is rotatable around a rotation axis perpendicular to an electron beam irradiation direction, the sample holder being capable of forming an airtight chamber around the sample stage. A sample is allowed to chemically react in any atmosphere, and three-dimensional analysis on the reaction is enabled. A sample liable to change in atmosphere can be three-dimensionally analyzed without exposing the sample to the atmosphere.
申请公布号 EP2495748(A4) 申请公布日期 2013.12.04
申请号 EP20100826621 申请日期 2010.10.22
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 YAGUCHI TOSHIE;NAGAKUBO YASUHIRA;AZUMA JUNZO;WATABE AKIRA
分类号 H01J37/20;G01N1/28;G01N23/225;H01J37/18;H01J37/24;H01J37/26 主分类号 H01J37/20
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