发明名称 |
COATING AND DEVELOPING DEVICE, COATING AND DEVELOPING METHOD, AND STORING MEDIUM |
摘要 |
PROBLEM TO BE SOLVED: To provide a technique that can suppress installation area of a processing block and suppress reduction of operation efficiency of a device.SOLUTION: A coating and developing device comprises a mode selector for selecting a feeding mode of a subsequent substrate from modes M1 and M2 on the basis of data stored in a storage unit when abnormality of a substrate is detected in an inspection by an inspection module. The mode M1 is a mode for specifying a module for which a substrate in a unit block for development processing is processed, and controlling operation of a feeding mechanism for the unit block so that a subsequent substrate is fed to a module other than the specified module. The module M2 is a mode for specifying a unit block for the development processing for which a substrate is processed, and controlling operation of a delivery mechanism so that a subsequent substrate is fed to a unit block for the development processing other than the specified unit block for the development processing. |
申请公布号 |
JP2013236109(A) |
申请公布日期 |
2013.11.21 |
申请号 |
JP20130168263 |
申请日期 |
2013.08.13 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
MATSUOKA NOBUAKI;MIYATA AKIRA;HAYASHI SHINICHI;ENOKIDA SUGURU;TOMITA HIROSHI;HAYAKAWA MAKOTO;YOSHIDA TAPPEI |
分类号 |
H01L21/027;G03F7/30 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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