发明名称 COATING AND DEVELOPING DEVICE, COATING AND DEVELOPING METHOD, AND STORING MEDIUM
摘要 PROBLEM TO BE SOLVED: To provide a technique that can suppress installation area of a processing block and suppress reduction of operation efficiency of a device.SOLUTION: A coating and developing device comprises a mode selector for selecting a feeding mode of a subsequent substrate from modes M1 and M2 on the basis of data stored in a storage unit when abnormality of a substrate is detected in an inspection by an inspection module. The mode M1 is a mode for specifying a module for which a substrate in a unit block for development processing is processed, and controlling operation of a feeding mechanism for the unit block so that a subsequent substrate is fed to a module other than the specified module. The module M2 is a mode for specifying a unit block for the development processing for which a substrate is processed, and controlling operation of a delivery mechanism so that a subsequent substrate is fed to a unit block for the development processing other than the specified unit block for the development processing.
申请公布号 JP2013236109(A) 申请公布日期 2013.11.21
申请号 JP20130168263 申请日期 2013.08.13
申请人 TOKYO ELECTRON LTD 发明人 MATSUOKA NOBUAKI;MIYATA AKIRA;HAYASHI SHINICHI;ENOKIDA SUGURU;TOMITA HIROSHI;HAYAKAWA MAKOTO;YOSHIDA TAPPEI
分类号 H01L21/027;G03F7/30 主分类号 H01L21/027
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