| 摘要 |
PURPOSE: A cell schematizing method using a transmission electron microscopy (TEM) boundary condition is provided to easily observe various mechanisms and a process of signal transmission by using a TEM. CONSTITUTION: A TEM obtains a phase by expanding an electron beam, which is passed through a sample, by using an electron lens. The TEM uses a thin film or a replica while observing the surface of the sample. The TEM observes a diffraction phase of the electron beam by changing the configuration of the electron lens. A cell schematizing method schematizes a cell according to a boundary condition profiling (BCP) technique. The cell schematizing method generates a 2.5 dimensional image for diagnosis. |
