发明名称 SKIN MEASUREMENT SYSTEM
摘要 PROBLEM TO BE SOLVED: To solve the problem that a conventional skin measurement system can only measure a small area and for instance, it is difficult to be used as a reference during foundation application.SOLUTION: A first light source having a peak wavelength from a wavelength of 700 nm to 1,100 nm and a second light source having a peak wavelength from a wavelength of 350 nm to 700 nm irradiate skin of such as a face in order. A signal obtained by measuring reflected light of the skin by irradiating the skin with light from the first light source and a signal obtained by measuring the reflected light of the skin by irradiating the skin with light from the second light source are subjected to a difference computation process. Accordingly, spots and freckles or the like on skin in a large area such as a face can be measured by a relatively inexpensive system.
申请公布号 JP2013212247(A) 申请公布日期 2013.10.17
申请号 JP20120083746 申请日期 2012.04.02
申请人 SHARP CORP 发明人 YAMAZAKI YUKIO;FUKUMOTO SHOHEI
分类号 A61B5/107;A61B5/00;G01N21/27 主分类号 A61B5/107
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