发明名称 Semiconductor device and method of manufacturing the semiconductor device
摘要 A semiconductor device in which MRAM is formed in a wiring layer A contained in a multilayered wiring layer, the MRAM having at least two first magnetization pinning layers in contact with a first wiring formed in a wiring layer and insulated from each other, a free magnetization layer overlapping the two first magnetization pinning layers in a plan view, and connected with the first magnetization pinning layers, a non-magnetic layer situated over the free magnetization layer, and a second magnetization pinning layer situated over the non-magnetic layer.
申请公布号 US8558334(B2) 申请公布日期 2013.10.15
申请号 US201213399475 申请日期 2012.02.17
申请人 UEKI MAKOTO;INOUE NAOYA;HAYASHI YOSHIHIRO;RENESAS ELECTRONICS CORPORATION 发明人 UEKI MAKOTO;INOUE NAOYA;HAYASHI YOSHIHIRO
分类号 H01L29/82;H01L21/00;H01L23/552;H01L27/08 主分类号 H01L29/82
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