发明名称 |
PROBABILISTIC FATIGUE LIFE PREDICTION USING ULTRASONIC INSPECTION DATA CONSIDERING EIFS UNCERTAINTY |
摘要 |
A method for probabilistically predicting fatigue life in materials includes sampling (41) a random variable for an actual equivalent initial flaw size (EIFS), generating (42) random variables for parameters (InC, m) of a fatigue crack growth equation [Formula should be inserted here] from a multivariate distribution, and solving (43) the fatigue crack growth equation using these random variables. The reported EIFS data is obtained by ultrasonically scanning a target object, recording echo signals from the target object, and converting echo signal amplitudes to equivalent reflector sizes using previously recorded values from a scanned calibration block. The equivalent reflector sizes comprise the reported EIFS data. |
申请公布号 |
CA2869597(A1) |
申请公布日期 |
2013.10.10 |
申请号 |
CA20132869597 |
申请日期 |
2013.04.03 |
申请人 |
SIEMENS CORPORATION;SIEMENS AKTIENGESELLSCHAFT |
发明人 |
GUAN, XUEFEI;ZHANG, JINGDAN;KADAU, KAI;ZHOU, SHAOHUA KEVIN |
分类号 |
G01N29/44;G01N17/00 |
主分类号 |
G01N29/44 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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