发明名称 |
MULTIPLE SURFACE INSPECTION SYSTEM AND METHOD |
摘要 |
A SYSTEM (100) FOR ON-THE-FLY INSPECTION OF COMPONENTS IS PROVIDED. THE SYSTEM (100) INCLUDES A PRISM STRUCTURE DISPOSED BELOW AN INSPECTION ITEM TRANSIT PATH. AN IMAGE DATA SYSTEM IS DISPOSED BELOW THE PRISM STRUCTURE. A LIGHTING ASSEMBLY (600) PROVIDES A FIRST LIGHTING SOURCE TO ILLUMINATE A PLURALITY OF SIDES OF AN INSPECTION ITEM (610) AND A SECOND LIGHTING SOURCE TO ILLUMINATE A BOTTOM OF THE INSPECTION ITEM (610). |
申请公布号 |
MY149611(A) |
申请公布日期 |
2013.09.13 |
申请号 |
MY2009PI01815 |
申请日期 |
2009.05.05 |
申请人 |
SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS PTE LTD |
发明人 |
AMANULLAH AJHARALI;GE HAN CHENG;TAN HUEK CHOY;LAI HING TIM |
分类号 |
G01N21/00 |
主分类号 |
G01N21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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