发明名称 MULTIPLE SURFACE INSPECTION SYSTEM AND METHOD
摘要 A SYSTEM (100) FOR ON-THE-FLY INSPECTION OF COMPONENTS IS PROVIDED. THE SYSTEM (100) INCLUDES A PRISM STRUCTURE DISPOSED BELOW AN INSPECTION ITEM TRANSIT PATH. AN IMAGE DATA SYSTEM IS DISPOSED BELOW THE PRISM STRUCTURE. A LIGHTING ASSEMBLY (600) PROVIDES A FIRST LIGHTING SOURCE TO ILLUMINATE A PLURALITY OF SIDES OF AN INSPECTION ITEM (610) AND A SECOND LIGHTING SOURCE TO ILLUMINATE A BOTTOM OF THE INSPECTION ITEM (610).
申请公布号 MY149611(A) 申请公布日期 2013.09.13
申请号 MY2009PI01815 申请日期 2009.05.05
申请人 SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS PTE LTD 发明人 AMANULLAH AJHARALI;GE HAN CHENG;TAN HUEK CHOY;LAI HING TIM
分类号 G01N21/00 主分类号 G01N21/00
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