发明名称 SEMICONDUCTOR WITH THROUGH-SUBSTRATE INTERCONNECT
摘要 Semiconductor devices are described that have a metal interconnect extending vertically through a portion of the device to the back side of a semiconductor substrate. A top region of the metal interconnect is located vertically below a horizontal plane containing a metal routing layer. Method of fabricating the semiconductor device can include etching a via into a semiconductor substrate, filling the via with a metal material, forming a metal routing layer subsequent to filling the via, and removing a portion of a bottom of the semiconductor substrate to expose a bottom region of the metal filled via.
申请公布号 US2013221446(A1) 申请公布日期 2013.08.29
申请号 US201313850840 申请日期 2013.03.26
申请人 MICRON TECHNOLOGY, INC.;MICRON TECHNOLOGY, INC. 发明人 KIRBY KYLE K.;PAREKH KUNAL R.
分类号 H01L23/498;H01L29/78 主分类号 H01L23/498
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