发明名称 Photomask blank, photomask, and photomask manufacturing method
摘要 A photomask blank has a light-shielding film composed of at least two layers on a transparent substrate. The light-shielding film includes a light-shielding layer made of a material mainly containing tantalum nitride and containing less than 62 at % nitrogen. The material is capable of being dry-etched with a chlorine-based gas containing no oxygen. The light-shielding film further includes a front-surface antireflection layer formed on the light-shielding layer and made of a material not capable of being dry-etched with a chlorine-based gas, but capable of being dry-etched with a fluorine-based gas.
申请公布号 US8518609(B2) 申请公布日期 2013.08.27
申请号 US201213467071 申请日期 2012.05.09
申请人 NOZAWA OSAMU;HOYA CORPORATION 发明人 NOZAWA OSAMU
分类号 G03F1/46;G03F1/50;G03F1/54;G03F1/58;G03F1/80;H01L21/027 主分类号 G03F1/46
代理机构 代理人
主权项
地址