发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method which can form a conductive film with less impurity without thermally damaging the semiconductor device, and which can avoid increase in the number of manufacturing processes.SOLUTION: A semiconductor device manufacturing method according to an embodiment comprises the steps of: selectively depositing a second conductive film on a first conductive film by using a CVD method while irradiating micro wave to a semiconductor substrate having the first conductive film and a first insulation film on a surface to maintain a state where a temperature of a surface of the first conductive film is 50°C or more higher in comparison with a surface of the first insulation film; and forming a third conductive film by performing heat treatment on the second conductive film to react the first conductive film with the second conductive film. |
申请公布号 |
JP2013149829(A) |
申请公布日期 |
2013.08.01 |
申请号 |
JP20120009968 |
申请日期 |
2012.01.20 |
申请人 |
TOSHIBA CORP |
发明人 |
HONDA AKIRA;AOYAMA TOMONORI |
分类号 |
H01L21/285;C23C16/04;C23C16/46;H01L21/28;H01L21/3205;H01L21/768;H01L23/532 |
主分类号 |
H01L21/285 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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