发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method which can form a conductive film with less impurity without thermally damaging the semiconductor device, and which can avoid increase in the number of manufacturing processes.SOLUTION: A semiconductor device manufacturing method according to an embodiment comprises the steps of: selectively depositing a second conductive film on a first conductive film by using a CVD method while irradiating micro wave to a semiconductor substrate having the first conductive film and a first insulation film on a surface to maintain a state where a temperature of a surface of the first conductive film is 50°C or more higher in comparison with a surface of the first insulation film; and forming a third conductive film by performing heat treatment on the second conductive film to react the first conductive film with the second conductive film.
申请公布号 JP2013149829(A) 申请公布日期 2013.08.01
申请号 JP20120009968 申请日期 2012.01.20
申请人 TOSHIBA CORP 发明人 HONDA AKIRA;AOYAMA TOMONORI
分类号 H01L21/285;C23C16/04;C23C16/46;H01L21/28;H01L21/3205;H01L21/768;H01L23/532 主分类号 H01L21/285
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