发明名称 |
DEPOSITION METHOD OF TiSiN FILM AND STORAGE MEDIUM |
摘要 |
PROBLEM TO BE SOLVED: To deposit a TiSiN film which has good controllability in an Si concentration and high stability.SOLUTION: A deposition method of a TiSiN film comprises: carrying a processed substrate in a processing container; maintaining the inside of the processing container in a reduced pressure; and repeating the following steps (1)-(3) of forming a TiSiN unit film on the processed substrate a plurality of times while heating the processed substrate: (1) a step of supplying a Ti-containing gas or a step of supplying a Ti-containing gas and a nitride gas; (2) a step of supplying a nitride gas; and (3) a step of supplying an Si-containing gas containing Cl. When the TiSiN film of a predetermined film thickness is deposited, a temperature during the deposition is set at a temperature at which Cl does not desorb from the Si-containing gas containing Cl. |
申请公布号 |
JP2013145796(A) |
申请公布日期 |
2013.07.25 |
申请号 |
JP20120005310 |
申请日期 |
2012.01.13 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
YAMASAKI HIDEAKI;KOIZUMI MASAKI;ISHIKAWA MAYUKO;YAMAMOTO TAKESHI;KAWABATA SATOSHI |
分类号 |
H01L21/285;C23C16/42;H01L21/28 |
主分类号 |
H01L21/285 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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